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Tests of small X-ray Active Matrix Pixel Sensor prototypes at the National Synchrotron Light Source
2009
Journal of Instrumentation
X-ray Active Matrix Pixel Sensors (XAMPS) were designed and fabricated at Brookhaven National Laboratory. Devices based on J-FET technology were produced on 100 mm highresistivity silicon, typically 400 µm-thick. The prototypes are square matrices with n rows and n columns with n=16, 32, 64, 128, 256, 512. Each pixel of the matrix is 90 × 90 µm 2 and contains a JFET switch to control the charge readout. The XAMPS is a position sensitive ionization detector made on high resistivity silicon. It
doi:10.1088/1748-0221/4/03/p03014
fatcat:3tsulc3wdrgqngyw4n4k4bcjty