Defect-related dark currents in III-V MWIR nBn detectors

G. R. Savich, D. E. Sidor, X. Du, M. Jain, C. P. Morath, V. M. Cowan, J. K. Kim, J. F. Klem, D. Leonhardt, S. D. Hawkins, T. R. Fortune, A. Tauke-Pedretti (+5 others)
2014 Infrared Technology and Applications XL  
doi:10.1117/12.2050535 fatcat:xrz7uhub6bbgdeler66lzelwhi