A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2018; you can also visit the original URL.
The file type is application/pdf
.
Direct Observation of Gain Compression Mechanisms in PHEMT by RF Gate and Drain Currents
unpublished
Average rf gate and drain currents can be used to determine gain compression mechanisms for PHEMTs with different pinch-off voltages. Knee voltage, pinch-off voltage, breakdown voltage and Imax clip output I-V waveform of a PHEMT and cause gain compression. We found that there is a distinct signature in average rf gate and drain currents to characterize each gain compression mechanism in PHEMTs. A PHEMT with low pinch-off voltage behaves the same in rf gate and drain currents as a PHEMT with
fatcat:nupxruf5xbbllm5y4e6tdzzn3i