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Defect Mapping and Adaptive Configuration of Nanoelectronic Circuits Based on a CNT Crossbar Nano-Architecture
2009
2009 Proceedings of 18th International Conference on Computer Communications and Networks
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Successful fabrication of a variety of nanoscale devices leads to research on nanoscale device integration, nano-architecture exploration, and nanoelectronic design techniques. This paper proposes a complete set of linear complexity catastrophic defect mapping techniques for CNT crossbar nano-architecture, as well as an adaptive CNT matching method for double gate CN-FETs in the presence of CNT misalignment. Combined with adaptive nano-addressing method, these proposed techniques enable
doi:10.1109/icccn.2009.5235271
dblp:conf/icccn/Liu09
fatcat:tvo3ode3mzh5nifkb7ju3wh2le