Analyses of Interfaces in Wafer-Bonded Tandem Solar Cells by Aberration-Corrected STEM and EELS

Dietrich Häussler, Lothar Houben, Rafal E. Dunin-Borkowski, Stephanie Essig, Frank Dimroth, Wolfgang Jäger
2014 Microscopy and Microanalysis  
doi:10.1017/s1431927614004000 fatcat:xb7zwybz5ncgdbjvinstj3p4v4