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In this work we examine how stitching interferometry can be used to provide both absolute calibration and also increased spatial resolution for the interferometric measurement of precision surfaces; both are important aspects of precision surface production. We examine the process of stitching as used to form a synthesized full-aperture measurement of a part from sub-aperture data. We then explain how to estimate and remove systematic errors in the interferometer by using the plurality ofdoi:10.1016/j.procir.2014.04.061 fatcat:r4fqma2yljckbimivm6oy4mc3q