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Spin polarization (SP) measurements of the secondary electron yield from ferromagnetic interfaces is a sensitive probe of surface and interface magnetism. By exploiting the jumps of the total photoionization cross section in correspondence of the L-edge excitation in transition metals one introduces a chemical sensitivity in the SP via the enhancement of the secondary emission from a specific magnetic or non magnetic specie at the interface. The hv-dependence of the SP in overlayer experimentsdoi:10.1051/jp4:1994929 fatcat:xdqf56fwyjaf5lwa5w4r2imula