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In deep submicron circuits, high temperatures have created critical issues in reliability, timing, performance, coolings costs and leakage power. Task migration techniques have been proposed to manage efficiently the thermal distribution in multi-processor systems but at the cost of important performance penalties. While traditional techniques have focused on reducing the average temperature of the chip, they have not considered the effect that temperature gradients have in system reliability.doi:10.1109/isvlsi.2010.39 dblp:conf/isvlsi/CuestaAHAAM10 fatcat:lcnihxonv5d7db5bjlmtx3mgnu