Flip-flops soft error rate evaluation approach considering internal single-event transient

RuiQiang Song, ShuMing Chen, YiBai He, YanKang Du
2015 Science China Information Sciences  
The internal single-event transient (SET) induced upset in flip-flops is becoming significant with the increase of the operating frequency. However, the conventional soft error rate (SER) evaluation approach could only produce an approximate upset prediction result caused by the internal SET. In this paper, we propose an improved SER evaluation approach based on Monte Carlo simulation. A novel SET-based upset model is implemented in the proposed evaluation approach to accurately predict upsets
more » ... aused by the internal SET. A test chip was fabricated in a commercial 65 nm bulk process to validate the accuracy of the improved SER evaluation approach. The predicted single-event upset cross-sections are consistent with the experimental data. Keywords soft error rate, Monte Carlo, internal SET, single-event upset, flip-flops Citation Song R Q, Chen S M, He Y B, et al. Flip-flops soft error rate evaluation approach considering internal single-event transient.
doi:10.1007/s11432-014-5260-z fatcat:e5qwd6ekmjgl3i5o4bcogkrogu