A versatile built-in cmos sensing device for digital circuit parametric test

M.S. Dragic, M. Margala
2003 IEEE Transactions on Instrumentation and Measurement  
A versatile CMOS current sensing device is proposed as a built-in-self-test monitor for conventional digital I DDQ power supply current test. A novel sensor topology is successfully employed in a current monitoring testing scheme. The sensor is implemented in two CMOS processes, 0.13µm and 0.18µm with 1.2V and 1.8V power supply, respectively. For verification purposes, performances of the 0.13µm design are investigated on several types of digital circuits: 64-bit RCA adder, 16-bit register, and
more » ... inverter chain. Our analysis shows excellent detection capabilities of non-catastrophic short and open defects. Overall performance penalty and power supply degradation of the circuit under test are evaluated on 1.2V 500-gate, 1000-gate, and 2000-gate asynchronous digital logic. Average power supply degradation of the 2000-gate logic tested at 20MHz is recorded to be less than 0.6% which produced a 250ps delay in the 100-gate critical path. The presented sensor is scalable and practical embedded solution for high-frequency parametric I DDQ test of standard CMOS digital circuits.
doi:10.1109/tim.2003.818725 fatcat:wf74eubor5hc3fnn7ydpdnr4ru