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A versatile built-in cmos sensing device for digital circuit parametric test
2003
IEEE Transactions on Instrumentation and Measurement
A versatile CMOS current sensing device is proposed as a built-in-self-test monitor for conventional digital I DDQ power supply current test. A novel sensor topology is successfully employed in a current monitoring testing scheme. The sensor is implemented in two CMOS processes, 0.13µm and 0.18µm with 1.2V and 1.8V power supply, respectively. For verification purposes, performances of the 0.13µm design are investigated on several types of digital circuits: 64-bit RCA adder, 16-bit register, and
doi:10.1109/tim.2003.818725
fatcat:wf74eubor5hc3fnn7ydpdnr4ru