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Material Property Analysis of Amorphous Metallic Thin Films as Diffusion Barrier Layer
2018
DEStech Transactions on Computer Science and Engineering
Amorphous metallic films have been considered to be the most effective barriers layer for Cu metallization due to the absence of grain boundaries and immiscibility with copper. The time and cost required for nano-scale experimant may be exceedingly large, and for this reason molecular dynamics have been used to analyze the material properties of CuAg amorphous metal films in this study, including the glass transition process of amorphous metal films, the effect of composition ratio and
doi:10.12783/dtcse/cmsam2018/26547
fatcat:5l7o43v6hzb5xcz3tevag5si6y