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Crystallization Kinetics in Ge-Sb-Te-Bi and Ge-Sb-Te-In Thin Films
2016
Proceedings of the 2016 International Conference on Mechanics, Materials and Structural Engineering
unpublished
In this work mechanism and kinetics of crystallization for thin films on the basis of Ge-Sb-Te-Bi and Ge-Sb-Te-In perspective for phase change memory application were investigated. Possible data processing and storage times of the PCM cell were estimated. It was shown that PCM cell based on Ge 2 Sb 2 Te 5 +0.5 wt. % Bi have minimum data processing and maximum data storage times in comparison with the other investigated materials.
doi:10.2991/icmmse-16.2016.62
fatcat:ddrds5iphrhurjju6hgv36x5iq