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Defect Contour Detection of Complex Structural Chips
2021
Mathematical Problems in Engineering
In the manufacture of chips, it is important to detect defects to assess whether the chip is potentially damageable that could cause unnecessary cost. Most assessment rules are set in light of characteristics determined by defect contours, such as area and range. However, conventional image process methods seldom show a satisfactory performance on chips with complex structures because they are difficult to distinguish defect contours from edges of structures. To solve this issue, this study
doi:10.1155/2021/5518675
fatcat:bd7kvtbyprel3oxgg623f2bddi