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Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440)
The model-independent analysis (MIA) method in accelerators has not yet come into widespread use, unfortunately. This is perhaps due to a lack of convenient tools to bring the measurement data to the results stage. At the Advanced Photon Source, we used the SDDS Toolkit and the SDDS-compliant EPICS Toolkit in simple and not-sosimple applications for diagnosing operational problems from beginning to end in a short time. We were able to make quantitative measurements of pulsed power supply noisedoi:10.1109/pac.2003.1289949 fatcat:2iugicrqxjdh7k45nthx2b3dbq