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Intermittent faults in combinational circuits may appear and disappear randomly; hence, their detection requires many repeated applications of test vectors. Since testing reduces the time available for computation, it is necessary to efficiently minimize the time required for a test, while still achieving a high degree of fault detection. This paper presents an optimal random test procedure to detect intermittent failures. The algorithm maximizes the probability of fault detection by optimallydoi:10.1109/tc.1980.1675595 fatcat:hl3pu5yylzdvlnfmbkx5ap3f6u