Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection

Savir
1980 IEEE transactions on computers  
Intermittent faults in combinational circuits may appear and disappear randomly; hence, their detection requires many repeated applications of test vectors. Since testing reduces the time available for computation, it is necessary to efficiently minimize the time required for a test, while still achieving a high degree of fault detection. This paper presents an optimal random test procedure to detect intermittent failures. The algorithm maximizes the probability of fault detection by optimally
more » ... hoosing the input vector probabilities. Index Terms-Error latency, intermittent fault detection, irredundant circuit, maximum likelihood estimator, random testing.
doi:10.1109/tc.1980.1675595 fatcat:hl3pu5yylzdvlnfmbkx5ap3f6u