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The observation and evaluation of lattice defects such as vacancies, dislocations, and grain boundaries are very important in materials design. Electrical resistivity measurement is superior to electron microscopy for obtaining average microstructural information, including density and type of lattice defects. The purpose of this study was to estimate changes in electrical resistivity during the tensile deformation of commercial-purity (CP) Ti. The electrical resistivity of a cold-rolled Tidoi:10.4144/rpsj.61.49 fatcat:2mqgbrj3nrcnfm2eotuxiwik3q