Internet Archive Scholar

Fluctuation of In composition in InGaAs Layer studied by TEM-CL technique
24pY-3 TEM : カソードルミネッセンス法によるInGaAs成長膜中のIn組成揺らぎ評価

T. Mita, N. Yamamoto
2000 Meeting Abstracts of the Physical Society of Japan (Nihon Butsuri Gakkai koen gaiyoshu)  

Preserved Fulltext

fulltext thumbnail
Web Archive Capture PDF (520.4 kB)
https://web.archive.org/web/20220519143345/https://www.jstage.jst.go.jp/article/jpsgaiyo/55.1.4/0/55.1.4_855_1/_pdf

A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2022; you can also visit the original URL. The file type is application/pdf.

doi:10.11316/jpsgaiyo.55.1.4.0_855_1 fatcat:vuavxbfw3zfizlwasnftvec4di
lang:ja
Citation

T. Mita, N. Yamamoto. "Fluctuation of In composition in InGaAs Layer studied by TEM-CL technique." Meeting Abstracts of the Physical Society of Japan (Nihon Butsuri Gakkai koen gaiyoshu) 55.1.4.0 (2000) 855