The Rudolph Research s2000 is a fully automated research grade spectroscopic ellipsometer operating in the UV-VIS-NIR spectral région from 250-850 nm. Sophisticated, yet easy to use, software allows complète control of measurement protocols and modeling parameters. Applications include the détermination of dielectric functions of materials in the bulk and thin-film phases, measurement of film thicknesses in complex multi-film stacks, investigations of the microstructure of microscopically

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... mogeneous films, the détermination of composition of non-stoichiometric materials, and many more. Call or write today to find out how a spectroscopic ellipsometer from Rudolph Research can provide new insights in your application. siem180 1.00 0.80 0.60 0.40 0.20 0.00 | -0.20 J -0.40 -0.60 -0.80 -1.00