Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates

A. Ivanov, F. Lombardi, C. Metra
2004 IEEE Design & Test of Computers  
IT IS WITH GREAT PLEASURE that we introduce the special issue on Testing at MultiGbps Rates to the IEEE Design & Test readership. Manufacturing today's high-performance digital systems requires VLSI testing at speeds of multigigabits per second (multiGbps). For this special issue, we've selected four articles to cover a wide spectrum of techniques and applications critical to testing at multiGbps rates. In these articles, outstanding researchers cover experimental and speculative topics. As
more » ... all special issues, these topics represent only the publicly available literature currently provided by the technical community. Recent years have seen the rapidly growing prominence of new techniques for testing ICs and systems with innovative features to allow high quality and fast test time. High-density, core-based ICs have recently gained popularity, yet the complexity of these chips can slow down product development and increase cost rather than provide high performance and profit margins in manufacturing. The new economy, the rising role of new technologies (such as SoC), and escalating costs for developing new products are forcing the electronic industry to reexamine existing approaches to design and test. For innovative products, the development of new technological environments promises to provide the greatest productivity increases-and therefore, the fastest time-to-market-while keeping costs under control. However, testing and debugging these devices are very difficult problems. Moreover, the industry recognizes that testing costs are escalating faster than other costs related to the development phase.
doi:10.1109/mdt.2004.31 fatcat:hgk624c2erbr7dsxolycrxu3jy