Oxidation Induced Anisotropic Deformation in Perfect Si Crystals. Dynamical X-Ray Diffraction Study

J. Burgeat, R. Caciuffo, J. Primot, F. Rustichelli
1982 Zeitschrift fur Naturforschung A-A Journal of Physical Sciences  
Double X-ray diffractometry has been used to investigate perfect Si crystals of different orientations, on which SiCO
doi:10.1515/zna-1982-0506 fatcat:rfz47ja5kngv3nhuy4wydmajg4