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Size effects in the electrical resistivity of polycrystalline nanowires
Physical Review B (Condensed Matter)
͑Received 12 November 1999͒ Grain-boundary and surface scattering are known to increase the electrical resistivity of thin metallic films and wires. The length scale at which these produce appreciable effects is of the order of the electronic mean free path. For the well-studied case of thin films, both mechanisms can, in principle, be used to explain the observed thickness dependence on resistivity. In order to evaluate which of these mechanisms is more relevant, we have carried out andoi:10.1103/physrevb.61.14215 fatcat:fc7rylzqvzcfljons6ergvpu6m