A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2007; you can also visit the original URL.
The file type is application/pdf.
Modifying the surface electronic properties of YBa2Cu3O7 with cryogenic scanning probe microscopy
2003
Superconductors Science and Technology
Preserved Fulltext
Other Versions
We report the results of a cryogenic study of the modification of YBa2Cu3O7-delta surface electronic properties with the probe of a scanning tunneling microscope (STM). A negative voltage applied to the sample during STM tunneling is found to modify locally the conductance of the native degraded surface layer. When the degraded layer is removed by etching, the effect disappears. An additional surface effect is identified using Scanning Kelvin Probe Microscopy in combination with STM. We observe
doi:10.1088/0953-2048/17/1/015
fatcat:tf7ramtelrbezfuylb3gjditvy