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Enhanced FIB-SEM systems for large-volume 3D imaging
2017
eLife
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) can automatically generate 3D images with superior z-axis resolution, yielding data that needs minimal image registration and related post-processing. Obstacles blocking wider adoption of FIB-SEM include slow imaging speed and lack of long-term system stability, which caps the maximum possible acquisition volume. Here, we present techniques that accelerate image acquisition while greatly improving FIB-SEM reliability, allowing the system
doi:10.7554/elife.25916
pmid:28500755
pmcid:PMC5476429
fatcat:fx6tlulba5hvlpjvttfr6g4f5i