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IET Irish Signals and Systems Conference (ISSC 2006)
Built-In-Test (BIT) for Radio Frequency (RF) integrated circuits can reduce the testing cost, especially with the increase of integration level and operating frequency. A fully integrated CMOS BIT detection circuit is presented in this work. This BIT detection circuit is rectifier-based and low threshold voltage diode-connected MOS transistor with substrate positively-biased is used to improve the detecting sensitivity. As an example, a 2.4GHz LNA is used, the high frequency small signal gaindoi:10.1049/cp:20060440 fatcat:vv7f4tcntze7fhkdq7ru7g5iom