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High reliability requirements in many modern applications make soft errors an extremely important design aspect and pose new challenges in nanometer technologies. In addition, timing faults that may escape fabrication tests become a real concern in high complexity, high frequency designs. To confront this situation, a concurrent error detection and correction circuit and technique are presented in this work. Their application in pipeline architectures is analyzed and the pipeline error recoverydoi:10.1109/icecs.2006.379883 dblp:conf/icecsys/FlorosTAH06 fatcat:ctigcooyofdlpmv7db3iaqb2ha