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Confocal laser scanning microscopy (CLSM) and scanning electron microscope (SEM) systems are commonly used for measuring the dimensions of laser-processed objects. Nevertheless, both methods require some time for preprocessing and measurement, thereby entailing high costs. We propose a simple, fast, and inexpensive method for measuring submicrometric structures using deep learning with multi-focus microphotographs taken using an optical microscope. The average errors in depth and height for adoi:10.2961/jlmn.2021.02.3001 fatcat:tg44xepl4vfjfkjn32mmwwdgse