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2018 12th International Conference on the Properties and Applications of Dielectric Materials (ICPADM)
Even if interfaces are more and more investigated their properties remain partially unknown, especially as regards their electronic properties. This is mainly related to the lack of characterization at relevant scale. In this context, electrical modes derivate from Atomic Force Microscopy appear well adapted. In this paper, a method to probe space charge at nanoscale is proposed. This method is based on surface potential measurement by Kelvin Probe Force Microscopy (KPFM) and post-processingdoi:10.1109/icpadm.2018.8401246 fatcat:qkys7hoilzgcldncbfaakokz3e