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Mapping the elastic properties of granular Au films by contact resonance atomic force microscopy
Endowed with nanoscale spatial resolution, contact resonance atomic force microscopy (CR-AFM) provides extremely localized elastic property measurements. We advance here the applicability of CR-AFM on surfaces with nanosize features by considering the topography contribution to the CR-AFM signal. On nanosize granular Au films, the elastic modulus at the grain scale has been mapped out by considering a self-consistent deconvolution of the contact geometry effect in the CR-AFM image. Significantdoi:10.1088/0957-4484/19/23/235701 pmid:21825800 fatcat:pdelnrrvy5gonoilyj365gzkau