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On Built-In Self-Test for multipliers
2010
Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)
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We evaluate some of the previously proposed test algorithms and approaches for various types of multipliers. We present methods to effectively test multipliers independent of their architecture and to achieve greater than 99% single stuckat gate-level fault coverage with a simple 8-bit or 9-bit binary up-counter and some multiplexers. Finally, we discuss testing the multipliers present in most current Field Programmable Gate Arrays (FGPAs). 1
doi:10.1109/secon.2010.5453929
fatcat:ezxkxgnyqbczlkq32d2x5an4ty