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Analysis of the linewidth of a grating-feedback GaAlAs laser
2000
IEEE Journal of Quantum Electronics
Preserved Fulltext
Effects of external optical feedback from a reflection grating on the linewidth of a GaAlAs semiconductor laser operating at 780 nm are investigated. Accurate linewidth measurements as a function of the laser frequency tuning have been performed by applying the self-homodyne technique with a short delay line. A realistic coupled-cavity model, which incorporates the frequency-dependent reflection from the grating, is used to explain the measured data. The agreement between the theoretical and
doi:10.1109/3.880660
fatcat:st73gopez5abpgct4x3biovwjm