In this paper, we performed a study of damage assessment model development to analyze the initial nuclear pulse radiation damage to semiconductor devices for military weapon systems. At first we modeled(M) the nuclear pulse radiation and diode device, and simulated(S) the output characteristics of the device to the input, Then the manufactured diodes which had the same characteristics with the modeled one were irradiated to the similar pulsed type radiation and their output signals were

more »

... simultaneously. Error between the M & S results and the measured values of the analysis was 22.9%. Through the error value we could confirm that the damage assessment model simulated the TREE effects with a quite accuracy. 키워드 펄스방사선, 피해현상, 평가체계, 평가모델, 감마방사선, 선량율