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Double Fe-impurity charge state in the topological insulator Bi2Se3
2017
Applied Physics Letters
The influence of individual impurities of Fe on the electronic properties of topological insulator Bi_2Se_3 is studied by Scanning Tunneling Microscopy. The microscope tip is used in order to remotely charge/discharge Fe impurities. The charging process is shown to depend on the impurity location in the crystallographic unit cell, on the presence of other Fe impurities in the close vicinity, as well as on the overall doping level of the crystal. We present a qualitative explanation of the
doi:10.1063/1.5002567
fatcat:35fhloqmlvfsfgfd73peuxpkp4