Development of a Wide-Spectral-Range High-Speed Spectrophotometer System for Measuring Hemispherical Reflectance and Normal Emittance of Surfaces Simultaneously(Thermal Engineering)
表面の半球反射率と垂直放射率の同時測定のための広波長域高速ふく射スペクトル測定装置の開発(熱工学,内燃機関,動力など)

Toshiro MAKINO, Hidenobu WAKABAYASHI
2009 TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series B  
Anew spectrophotometer systern is developed for the study ofthermal radiation charac し eristics of surfaces inthermal engineering enviro1 ユ ments . The sys 亡 em measures spectru ofnerrnal incidence hemispherical reflectance RNH and normal emittancc εN in a near . . ultravi ( 〕】 et through infrared region of wavelength ef O . 3{ ) -11Fm simultaneousty and repeatedly with a cycle time Qf 4 s、 The system enables us to evaluate the normul incidence absorptance AN in this w ide spectral regic ) 11 .
more » ... ectral regic ) 11 . Spectrum trans { t!ion of specular finished and rough − finished nickel surfaces in a high temperature air oxida − ti〔>n process is measured to demonstrate the performance ofthe system . Cleur interference behaviりrs are found even in the spectra ef hemispherlcal refiectance l-. NLI and emittance ε N Qf 吐 he rough − finished surface 、
doi:10.1299/kikaib.75.754_1329 fatcat:6eldhyo3zvdpbiqcvoh7injejy