Net diagnosis using stuck-at and transition fault models

Lixing Zhao, Vishwani D. Agrawal
2012 2012 IEEE 30th VLSI Test Symposium (VTS)  
As deep sub-micron technologies are widely adopted in modern VLSI design and fabrication process, the shrinking size and increasing complexity of digital circuits make it more difficult to maintain a high yield. Diagnosis is the procedure used when circuit verification fails. Determining the cause of the failure and finding the possible defect locations are included in diagnosis. In this thesis, a procedure of diagnosing multiple net-faults is proposed. Many previous studies on fault diagnosis
more » ... ainly focused on single failures. However, Vishwani D. Agrawal, the James J. Danaher Professor at Electrical Engineering Department. Without his kindness, patience and continuous guidance during my research and course of study, this thesis would not have been completed. I really appreciate all his encouragement and effort to help me get through those struggling days of my research.
doi:10.1109/vts.2012.6231106 dblp:conf/vts/ZhaoA12 fatcat:cbnggxfzlrautlkmfxlx5q3dyi