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Design and Fabrication of an NIR Grism Si Optical Area Sensor Spectrometer with In-band Reference Wavelength
대역 내 기준 파장을 갖는 근적외선 그리즘 실리콘 광 면 센서 분광기 설계 및 제작
2017
Journal of Sensor Science and Technology
대역 내 기준 파장을 갖는 근적외선 그리즘 실리콘 광 면 센서 분광기 설계 및 제작
An NIR grism Si optical area sensor spectrometer with in-band reference wavelength is designed and fabricated. It is composed of a transmission type diffraction grating (spatial density 300 line/mm), a rectangular N-BK7 prism (apex angle 30 degree), NIR filter(cutoff wavelength 720 nm), an imaging convex lens(focal length 50 mm F1.8) and an IR modified DSLR camera (Canon EOS40D) of Si optical area sensor (3,888 × 2,592 pixels, pixel size 5.710 µm). "In-band reference wavelength function" is
doi:10.5369/jsst.2017.26.1.28
fatcat:kpiib7isjrfvncueantlzfzvo4