Characterization of a pseudo-random testing technique for analog and mixed-signal built-in-self-test

J.M. Tofte, Chee-Kian Ong, Jiun-Lang Huang, Kwang-Ting Cheng
Proceedings 18th IEEE VLSI Test Symposium  
doi:10.1109/vtest.2000.843851 dblp:conf/vts/TofteOHC00 fatcat:s6dzxerg25hghednd4uezw4rze