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An Effective Technique for Minimizing the Cost of Processor Software-Based Diagnosis in SoCs
Design, Automation, and Test in Europe
The ever increasing usage of microprocessor devices is sustained by a high volume production that in turn requires a high production yield, backed by a controlled process. Fault diagnosis is an integral part of the industrial effort towards these goals. This paper presents a novel cost-effective approach to the construction of diagnostic software-based test sets for microprocessors. The methodology exploits an existing post-production test set, designed for software-based self-test, and andoi:10.1007/978-1-4020-6488-3_36 fatcat:out2igktqverjgiu7c2l66myqa