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Method to calculate electric fields at very small tip-sample distances in atomic force microscopy
2010
Applied Physics Letters
Preserved Fulltext
Articles you may be interested in An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact Rev. Sci. Instrum. 81, 073711 (2010); 10.1063/1.3459886 Tip-sample distance control using photothermal actuation of a small cantilever for high-speed atomic force microscopy Rev. Sci. Instrum. 78, 083702 (2007) ;
doi:10.1063/1.3467676
fatcat:ahsblxf77fgepnf56tijxk4hz4