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Performance improvement of in - line chiral measurement system based on a polarization - analyzing CMOS image sensor
偏光計測CMOSイメージセンサを用いたマイクロリアクタ向け不斉反応計測デバイスの性能向上
2016
Proceedings of the ITE Annual Convention
偏光計測CMOSイメージセンサを用いたマイクロリアクタ向け不斉反応計測デバイスの性能向上
Preserved Fulltext
We have developed a polarization-analyzing CMOS image sensor. We made a palm-size in-line chiral analysis device for microchemistry systems, and succeeded in real-time measurements. In this work, we designed a new polarization-analyzing device with improved performance.
doi:10.11485/iteac.2016.0_21e-2
fatcat:dn4gv3jjzbcb3adimqsg47pxei