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A phase field model for the electromigration of intergranular voids
2007
Interfaces and free boundaries (Print)
We propose a degenerate Allen-Cahn/Cahn-Hilliard system coupled to a quasi-static diffusion equation to model the motion of intergranular voids. The system can be viewed as a phase field system with an interfacial parameter γ . In the limit γ → 0, the phase field system models the evolution of voids by surface diffusion and electromigration in an electrically conducting solid with a grain boundary. We introduce a finite element approximation for the proposed system, show stability bounds, prove
doi:10.4171/ifb/161
fatcat:26f355oxfvcpbjxdxuyct2h4pq