Call for Papers

2020 2020 IEEE International Integrated Reliability Workshop (IIRW)  
The IEEE International Integrated Reliability Workshop (IIRW) focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems.
doi:10.1109/iirw49815.2020.9312863 fatcat:ifi2ijycqzc7fpumkcw4udml4e