Aging Effects and Modeling Researches on 22nm FDSOI MOSFETs

Yibo Hu, Hao Ge, Zhipeng Ren, Yizhe Yin, Jing Chen
2022 Zenodo  
OUTLINE: Background Aging Effects Modeling Dynamic Voltage Stress SMI Simulator Summary
doi:10.5281/zenodo.7048176 fatcat:hgro2eowsnalpf6b5udsdcsmie