A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2022; you can also visit the original URL.
The file type is application/pdf
.
Aging Effects and Modeling Researches on 22nm FDSOI MOSFETs
2022
Zenodo
OUTLINE: Background Aging Effects Modeling Dynamic Voltage Stress SMI Simulator Summary
doi:10.5281/zenodo.7048176
fatcat:hgro2eowsnalpf6b5udsdcsmie