c-dimensions of Ceylon graphite have been measured by X-ray diffraction method in the range 25-800•Ž with a camera specially designed for this purpose. The diameter of the camera is 24 cm, NiKƒ¿1 rays being used for 0008 line. The shifts of the line by temperature rise are fairly large and about 4 mm per 100•Ž, which permit four or more diffracted lines at different temperatures to be photographed on a fixed film through a movable aperture. The changes of the c-dimensions