The features of surface plasmon resonance in gold cluster films

L. S. Maksimenko, V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine 45, prospect Nauky, Kyiv 03028, Ukraine Phone: 38-(044) 525-57-78, e-mail: serdega@isp.kiev.ua
2009 Semiconductor Physics, Quantum Electronics & Optoelectronics  
The internal reflection of nanosized gold cluster films was studied using the technique of polarization modulation of electromagnetic radiation in the Kretschmann geometry. We measured the reflection coefficients R s and R p of s-and p-polarized radiation, respectively, as well as their polarization difference ∆R = R s − R p , as function of the light incidence angle in the 0.4÷1.6 µm wavelength range. A topological size effect was found; it consists in dependence of the value and sign of
more » ... e and sign of curvature of the polarization difference characteristics on the film surface properties. It is shown that the sign of curvature of ∆R characteristics depends on the radiation wavelength λ and indicates resonance interaction with a metal film of either p-polarized radiation only or that of both polarizations. The spectral characteristic of the topological size effect in the resonance interaction is obtained from the condition of isotropic reflection, ∆R = R s − R p = 0, and its dependence on the radiation wavelength.
doi:10.15407/spqeo12.02.129 fatcat:hfswaofdsvcevp62vzoyqk3r3m