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Full-wave analysis of multiple lossy microstrip lines on multilayered bi-anisotropic substrates and imperfect ground metallization
1993 IEEE MTT-S International Microwave Symposium Digest
Preserved Fulltext
An extended spectral-domain immittance approach is used to analyze multiconductor systems on layered bi-anisotropic substrates. Apart from the losses of the bi-anisotropic layers, the method takes into account the metallization thickness and losses of both the ground metallization and the multi-con-
doi:10.1109/mwsym.1993.277039
fatcat:7wb3nfqp4rgslilpdbc6526x2u