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Binary codes over 2D arrays are very useful in data storage, where each array column represents a storage device or unit that may suffer failure. In this paper, we propose a new framework for probabilistic construction of codes on 2D arrays. Instead of a pure combinatorial erasure model used in traditional array codes, we propose a mixed combinatorialprobabilistic model of limiting the number of column failures, and assuming a binary erasure channel in each failing column. For this model, wedoi:10.1109/tit.2014.2313720 fatcat:527v5jryybcnxd7s3ajltjslhy