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Transmission Electron Microscopy (TEM): TEM measurements were performed on a JEOL, JEM 3010 operated at 300 kV. Samples were prepared by placing a drop of the solution on carbon coated copper grids followed by drying at room temperature. The images were recorded with an operating voltage 300 kV. In order to get a better contrast sample was stained with uranyl acetate (1 wt % in water) before the measurements. For TEM, water was used instead of aq. HEPES solution to avoid masking ofdoi:10.1039/c2cc35438a pmid:22983556 fatcat:uf5i4jpal5conmpnv2fnxcytdi