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Effects of length dispersity and film fabrication on the sheet resistance of copper nanowire transparent conductors
2015
Nanoscale
A combination of Rutherford Backscattering Spectrometry and Monte Carlo simulations were used to characterize the effect of post-treatment methods, area coverage and length distribution on the performance of copper nanowire-based transparent conductors.
doi:10.1039/c5nr03671b
pmid:26260532
fatcat:2gkgdwqizfc4fm7isn7lazwrbi