Effects of length dispersity and film fabrication on the sheet resistance of copper nanowire transparent conductors

James W. Borchert, Ian E. Stewart, Shengrong Ye, Aaron R. Rathmell, Benjamin J. Wiley, Karen I. Winey
2015 Nanoscale  
A combination of Rutherford Backscattering Spectrometry and Monte Carlo simulations were used to characterize the effect of post-treatment methods, area coverage and length distribution on the performance of copper nanowire-based transparent conductors.
doi:10.1039/c5nr03671b pmid:26260532 fatcat:2gkgdwqizfc4fm7isn7lazwrbi