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An experimental study of charge diffusion in the undepleted silicon of X-ray CCDs
2003
IEEE Transactions on Electron Devices
We have experimentally studied the diffused electron clouds formed by X-ray photons interacting within the undepleted bulk of silicon beneath the depleted region of an X-ray CCD. Usually, such events are spread over multiple pixels and are often rejected in data analysis because of incomplete charge collection in the undepleted bulk. Unusual CCD clocking mode where every 100 sequential rows were summed in the serial register allowed us to reduce the charge distribution to a one-dimensional
doi:10.1109/ted.2002.806470
fatcat:cyqpmf3p6jhcfpfildk3m5antm