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Thermal Fragmentation of C60 in Argon Gas
2002
TANSO
Thermal decomposition of C60 was studied by x-ray diffraction and time-of-flight mass spectroscopy, which was carried out in a high-purity argon gas for 3h at the temperature ranging from 500 to 1000•Ž. The diffraction peaks corresponding to C60 of cubic system were detected in the samples heated below 500•Ž. With the increase of temperature, these peaks of C60 were broadened, and the diffraction peaks corresponding to chaoite of hexagonal system were detected. From time-of-flight spectroscopy,
doi:10.7209/tanso.2002.263
fatcat:tp5q7tyqyjhebdjvmuvzxtau5i